• DocumentCode
    2885347
  • Title

    Electron mobility variance in metals and degenerate semiconductors

  • Author

    Surmalyan, Ash V.

  • Author_Institution
    Dept. of Semicond. Phys. & Microelectron., Yerevan State Univ., Yerevan, Armenia
  • fYear
    2013
  • fDate
    24-28 June 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Electron mobility variance in metals and degenerate semiconductors is discussed on the basis of distribution function fluctuation approach. An analytical expression for electron mobility variance is obtained and analyzed. It is established that the mobility variance in Fermi gas depends on average electron concentration, temperature and the electron scattering mechanism. It is revealed that mobility variance dependencies on average electron number and average electron concentration are different: the dependence on average electron number is described by the inverse proportional law but the dependence on average electron concentration is determined by the -5/3 law.
  • Keywords
    electron gas; electron mobility; semiconductors; Fermi gas; average electron concentration; distribution function fluctuation approach; electron mobility variance; electron scattering mechanism; inverse proportional law; metal; semiconductor degeneration; Distribution functions; Electron mobility; Fluctuations; Metals; Scattering; Temperature dependence; Fermi gas; distribution function; electron mobility variance; fluctuation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2013 22nd International Conference on
  • Conference_Location
    Montpellier
  • Print_ISBN
    978-1-4799-0668-0
  • Type

    conf

  • DOI
    10.1109/ICNF.2013.6578973
  • Filename
    6578973