DocumentCode
2885347
Title
Electron mobility variance in metals and degenerate semiconductors
Author
Surmalyan, Ash V.
Author_Institution
Dept. of Semicond. Phys. & Microelectron., Yerevan State Univ., Yerevan, Armenia
fYear
2013
fDate
24-28 June 2013
Firstpage
1
Lastpage
3
Abstract
Electron mobility variance in metals and degenerate semiconductors is discussed on the basis of distribution function fluctuation approach. An analytical expression for electron mobility variance is obtained and analyzed. It is established that the mobility variance in Fermi gas depends on average electron concentration, temperature and the electron scattering mechanism. It is revealed that mobility variance dependencies on average electron number and average electron concentration are different: the dependence on average electron number is described by the inverse proportional law but the dependence on average electron concentration is determined by the -5/3 law.
Keywords
electron gas; electron mobility; semiconductors; Fermi gas; average electron concentration; distribution function fluctuation approach; electron mobility variance; electron scattering mechanism; inverse proportional law; metal; semiconductor degeneration; Distribution functions; Electron mobility; Fluctuations; Metals; Scattering; Temperature dependence; Fermi gas; distribution function; electron mobility variance; fluctuation;
fLanguage
English
Publisher
ieee
Conference_Titel
Noise and Fluctuations (ICNF), 2013 22nd International Conference on
Conference_Location
Montpellier
Print_ISBN
978-1-4799-0668-0
Type
conf
DOI
10.1109/ICNF.2013.6578973
Filename
6578973
Link To Document