Title :
Electron mobility variance in metals and degenerate semiconductors
Author :
Surmalyan, Ash V.
Author_Institution :
Dept. of Semicond. Phys. & Microelectron., Yerevan State Univ., Yerevan, Armenia
Abstract :
Electron mobility variance in metals and degenerate semiconductors is discussed on the basis of distribution function fluctuation approach. An analytical expression for electron mobility variance is obtained and analyzed. It is established that the mobility variance in Fermi gas depends on average electron concentration, temperature and the electron scattering mechanism. It is revealed that mobility variance dependencies on average electron number and average electron concentration are different: the dependence on average electron number is described by the inverse proportional law but the dependence on average electron concentration is determined by the -5/3 law.
Keywords :
electron gas; electron mobility; semiconductors; Fermi gas; average electron concentration; distribution function fluctuation approach; electron mobility variance; electron scattering mechanism; inverse proportional law; metal; semiconductor degeneration; Distribution functions; Electron mobility; Fluctuations; Metals; Scattering; Temperature dependence; Fermi gas; distribution function; electron mobility variance; fluctuation;
Conference_Titel :
Noise and Fluctuations (ICNF), 2013 22nd International Conference on
Conference_Location :
Montpellier
Print_ISBN :
978-1-4799-0668-0
DOI :
10.1109/ICNF.2013.6578973