Title :
Non-volatile Si quantum memory with self-aligned doubly-stacked dots
Author :
Ohba, R. ; Sugiyama, N. ; Uchida, K. ; Koga, J. ; Toriumi, A.
Author_Institution :
Adv. LSI Technol. Lab., Toshiba Corp., Yokohama, Japan
Abstract :
We investigate a novel Si quantum memory, in which floating gates are self-aligned doubly stacked Si dots. It is experimentally shown that the self-aligned double dot memory shows excellent charge retention. The retention improvement is explained by a theoretical model considering quantum confinement and Coulomb blockade in the lower Si dot. It is also shown that charge retention is improved remarkably by lower dot size scaling without losing high-speed write/erase.
Keywords :
Coulomb blockade; MOS memory circuits; elemental semiconductors; high-speed integrated circuits; nanotechnology; semiconductor quantum dots; silicon; tunnelling; Coulomb blockade; Si; charge retention; dot size scaling; high-speed write/erase; nanocrystalline dot memory; nonvolatile quantum memory; quantum confinement; self-aligned doubly-stacked dots; tunnel oxide; Electrons; Facsimile; Laboratories; Large scale integration; Materials science and technology; Nonvolatile memory; Potential well; Quantum dots; Quantum mechanics; US Department of Transportation;
Conference_Titel :
Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-6438-4
DOI :
10.1109/IEDM.2000.904319