Title :
Load-pull measurements using characterised matching network and variable load [UHF bipolar transistors]
Author :
Chan, Wing-Shing ; Fan, Chi-Wing ; Yip, Peter C L
Author_Institution :
Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
Abstract :
Load-pull measurements are traditionally performed using stub tuners which can be unreliable and difficult to use. The authors present a method which minimises the use of stub tuners, and by using characterised components reduces the measurement time considerably
Keywords :
bipolar transistors; microwave measurement; power transistors; semiconductor device testing; solid-state microwave devices; UHF bipolar transistors; characterised matching network; load pull measurement; power transistors; stub tuners; variable load; Digital control; Frequency measurement; Impedance measurement; Manufacturing; Measurement techniques; Phase shifters; Power generation; Power measurement; Tuners; UHF measurements;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184369
