DocumentCode :
2885405
Title :
Research of OPTICAl properties of AMORPHOUs dielectric structures with inclusions of nanocrystallites of silicon
Author :
Budko, D.A. ; Yafarov, R.K.
Author_Institution :
Saratov State Univ. in the name of N.G. Chernyshevskiy, Saratov, Russia
fYear :
2010
fDate :
22-23 Sept. 2010
Firstpage :
87
Lastpage :
92
Abstract :
Influence of dimensional effects on optical properties of composite nanostructures on the basis of amorphous hydrogenated carbide of silicon with inclusions of nanocrystallites of silicon is investigated. It is shown that in spectra of transmission of such structures displacement, in comparison with spectral characteristics of homogeneous films, in area of shorter lengths of the waves which size is defined by the size of nanocrystallites and thickness of a matrix is observed.
Keywords :
amorphous semiconductors; dielectric materials; inclusions; nanostructured materials; silicon compounds; SiC; amorphous dielectric structures; amorphous hydrogenated carbide; inclusions; nanocrystallites; optical properties; Dielectrics; Electronic mail; Nanostructures; Optical films; Silicon; Silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4244-6954-3
Type :
conf
DOI :
10.1109/APEDE.2010.5624025
Filename :
5624025
Link To Document :
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