Title :
A new development of failure bound method-diagnosable conditions with application for analog systems
Author :
Zhou, Shi Ying ; Lin, Zheng Hui
Author_Institution :
VLSI Res. Inst., Shanghai Jiao Tong Univ., China
Abstract :
The failure bound method for analog fault diagnosis is developed in this paper. The necessary and sufficient condition for diagnosability of a faulty set as an analytic condition is derived. Based on these conditions another form of pseudo circuit is created, so that the diagnosis process can be continued with insufficient test points. Furthermore, a graphical condition for the diagnosability of a faulty set is also presented. Finally, a diagnosis algorithm is proposed with an example
Keywords :
analogue circuits; fault location; network analysis; analog fault diagnosis; diagnosability; diagnosis algorithm; failure bound method; faulty set; graphical condition; pseudo circuit; Analytical models; Circuit faults; Circuit simulation; Equations; Frequency domain analysis; Testing;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184396
