DocumentCode
2885802
Title
A new development of failure bound method-diagnosable conditions with application for analog systems
Author
Zhou, Shi Ying ; Lin, Zheng Hui
Author_Institution
VLSI Res. Inst., Shanghai Jiao Tong Univ., China
fYear
1991
fDate
16-17 Jun 1991
Firstpage
486
Abstract
The failure bound method for analog fault diagnosis is developed in this paper. The necessary and sufficient condition for diagnosability of a faulty set as an analytic condition is derived. Based on these conditions another form of pseudo circuit is created, so that the diagnosis process can be continued with insufficient test points. Furthermore, a graphical condition for the diagnosability of a faulty set is also presented. Finally, a diagnosis algorithm is proposed with an example
Keywords
analogue circuits; fault location; network analysis; analog fault diagnosis; diagnosability; diagnosis algorithm; failure bound method; faulty set; graphical condition; pseudo circuit; Analytical models; Circuit faults; Circuit simulation; Equations; Frequency domain analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CICCAS.1991.184396
Filename
184396
Link To Document