Two new torn-searched approaches and its diagnosability [analog circuits]

The authors present two new torn-searched approaches for fault diagnosis at subnetwork-level in analog circuits and verify its practical diagnosability. These approaches break through the limitation that all torn terminals (incident nodes) must be accessible and the mutual-testing way must be utilized to locate the faulty subnetworks. As far as diagnosability is concerned, its applications would be more extensive as compared with the unified decomposition approach