Title :
Interval test method for fault location of the analog circuit with element tolerance
Author :
Bing-Kun, Xiong ; Yong-Gao, Yang
Author_Institution :
Dept. of Electr. Eng., Tongji Univ., Shanghai, China
Abstract :
The theory of interval algebra has been used for tolerance analysis in circuit design in recent years, but not yet applied to fault diagnosis. In this paper the authors present an interval test method for fault location of analog circuits with tolerance (DC linear or nonlinear). The method is based on the theory of interval analysis. The advantage of this method is that it is simple, intuitive and easy to compute
Keywords :
algebra; analogue circuits; fault location; network analysis; testing; analog circuit; element tolerance; fault diagnosis; fault location; interval algebra; interval test method; tolerance analysis; Analog circuits; Circuit faults; Circuit testing; Equations; Fault diagnosis; Fault location; Jacobian matrices; Vectors;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184401
