Title :
A method of test generation for large combinational circuits using input vector in pairs
Author :
Mingjian, Liu ; Jiehua, Peng
Author_Institution :
Guangdong Inst. of Technol., China
Abstract :
The authors investigate a new method of test generation for large combinational circuits using input vectors in pairs. The forming rules of the best test codes are derived and analysed. The cut theorem and cut test generation are studied. The experiment results are completely in accordance with the theory. This proves that the test generation approach given the paper is correct and useful
Keywords :
combinatorial circuits; fault location; logic testing; cut theorem; fault diagnosis; input vector pairs; large combinational circuits; logic circuits; test generation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Digital circuits; Fault diagnosis;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184402
