• DocumentCode
    2885895
  • Title

    A 1.5 V high performance mixed signal integration with indium channel for 130 nm technology node

  • Author

    Morifuji, E. ; Oishi, A. ; Miyashita, K. ; Aota, S. ; Nishigori, M. ; Ootani, H. ; Nakayama, T. ; Miyamoto, K. ; Matsuoka, F. ; Noguchi, T. ; Kakumu, M.

  • Author_Institution
    System LSI Div., Toshiba Corp., Yokohama, Japan
  • fYear
    2000
  • fDate
    10-13 Dec. 2000
  • Firstpage
    459
  • Lastpage
    462
  • Abstract
    In this paper, mixed signal LSI operating at a single drain voltage of 1.5 V is shown. Integration of high performance logic MOSFET with analog MOSFET is achieved by optimizing channel structures. Very high performance and competitive drive currents of 830 /spl mu/A//spl mu/m for nMOS and 390 /spl mu/A//spl mu/m for pMOS at 1 nA//spl mu/m off currents are achieved by careful halo optimization in logic MOSFET. In analog part, indium channel is applied for satisfying low threshold voltage specification which comes from dynamic range viewpoint. This indium channel MOSFET shows superior analog performance. By applying indium retrograde channel, high DC gain values which are approximately ten times lager than the uniform boron channel case are achieved in addition to wide bandwidth and good Vth matching. It is found that well anneal temperature which is carried out soon after channel ion implantation is very sensitive to analog performance in indium retrograde channel. This optimization is significant for DC gain and matching.
  • Keywords
    MOS integrated circuits; circuit optimisation; large scale integration; mixed analogue-digital integrated circuits; 1.5 V; 130 nm; DC gain values; analog MOSFET; bandwidth; channel structures; drain voltage; drive currents; halo optimization; logic MOSFET; mixed signal LSI; retrograde channel; well anneal temperature; Annealing; Bandwidth; Boron; Dynamic range; Indium; Large scale integration; Logic; MOS devices; MOSFET circuits; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-6438-4
  • Type

    conf

  • DOI
    10.1109/IEDM.2000.904355
  • Filename
    904355