Title :
Using of self-contained microprocessor applications at dynamic testing of amplifier
Author :
Krasnobelmov, V.P. ; Kogan, V.L. ; Pylskiy, V.A. ; Emelianov, V.V. ; Porognjakov, A.K.
Author_Institution :
Fed. State Unitary Enterprise SPE Almaz, Saratov, Russia
Abstract :
The idea of using of self-contained microprocessor applications for tracking and analysis of transient processes at the initiation of travelling-wave tube (TWT) by high-voltage power supply is proposed. The schematic diagram of the suggested device on the basis of microcontroller ATmega128 is presented.
Keywords :
amplifiers; circuit testing; dynamic testing; microcontrollers; power supply circuits; transient analysis; travelling wave tubes; amplifier dynamic testing; high-voltage power supply; microcontroller ATmega128; self-contained microprocessor applications; transient process analysis; travelling-wave tube; Digital signal processing; Electron tubes; Microcontrollers; Power supplies; Testing; Transient analysis;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4244-6954-3
DOI :
10.1109/APEDE.2010.5624065
