DocumentCode
2886132
Title
Using of self-contained microprocessor applications at dynamic testing of amplifier
Author
Krasnobelmov, V.P. ; Kogan, V.L. ; Pylskiy, V.A. ; Emelianov, V.V. ; Porognjakov, A.K.
Author_Institution
Fed. State Unitary Enterprise SPE Almaz, Saratov, Russia
fYear
2010
fDate
22-23 Sept. 2010
Firstpage
474
Lastpage
478
Abstract
The idea of using of self-contained microprocessor applications for tracking and analysis of transient processes at the initiation of travelling-wave tube (TWT) by high-voltage power supply is proposed. The schematic diagram of the suggested device on the basis of microcontroller ATmega128 is presented.
Keywords
amplifiers; circuit testing; dynamic testing; microcontrollers; power supply circuits; transient analysis; travelling wave tubes; amplifier dynamic testing; high-voltage power supply; microcontroller ATmega128; self-contained microprocessor applications; transient process analysis; travelling-wave tube; Digital signal processing; Electron tubes; Microcontrollers; Power supplies; Testing; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4244-6954-3
Type
conf
DOI
10.1109/APEDE.2010.5624065
Filename
5624065
Link To Document