Title :
Some circuit applications of the field effect current limiter
Author_Institution :
Bell Labs., Inc., Murray Hill, NJ, USA
Keywords :
Avalanche breakdown; Breakdown voltage; Capacitors; Current limiters; Diodes; Electric breakdown; Frequency; Resistors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1959 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1959.1157026
