DocumentCode :
2886203
Title :
Voltage drop in switch high-voltage vacuum electronic devices
Author :
Perevodchikov, V.I. ; Stalkov, P.M.
Author_Institution :
All-Russian Electrotech. Inst. in the name of V.I. Lenin (FGUP VEI), Moscow, Russia
fYear :
2010
fDate :
22-23 Sept. 2010
Firstpage :
454
Lastpage :
459
Abstract :
Now high-voltage switch devices find wider application in the powerful high-voltage electrotechnical equipment. Alongside with use of vacuum circuit-breakers with a mechanical drive there was a need for the high-speed switch device on the basis of electronic devices. For the decision of a problem of creation of a high-speed high-voltage switch it is expedient to use vacuum electronic devices. In particular, the individual vacuum device is capable to switch high voltage (up to 200 kV) while, for switching such voltage with semi-conductor devices it is required series connection of several tens devices. It is obvious, that reliability of such system will be inversely proportional to quantity of series connected semi-conductors. The vacuum high-voltage device possesses greater operation speed in comparison with semi-conductor, it is capable to work at temperature up to 300° C, moreover it withstand breakdowns and electromagnetic interferences. However, the basic obstacle for wide use of vacuum devices as a switch is the big direct voltage drop on opened device. The principle of deceleration of electron beam is used to decrease a direct voltage drop on the anode. The present work is devoted to questions of reduction of a direct voltage drop on the vacuum electronic switch device.
Keywords :
electric potential; electromagnetic interference; high-voltage techniques; semiconductor device breakdown; vacuum circuit breakers; direct voltage drop; electromagnetic interferences; electron beam deceleration; high speed high voltage vacuum electronic switch devices; mechanical drive; powerful high voltage electrotechnical equipment; series connected semiconductor devices; vacuum circuit breakers; Anodes; Electric breakdown; Electromagnetics; Electronic mail; Reliability; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4244-6954-3
Type :
conf
DOI :
10.1109/APEDE.2010.5624069
Filename :
5624069
Link To Document :
بازگشت