• DocumentCode
    2886203
  • Title

    Voltage drop in switch high-voltage vacuum electronic devices

  • Author

    Perevodchikov, V.I. ; Stalkov, P.M.

  • Author_Institution
    All-Russian Electrotech. Inst. in the name of V.I. Lenin (FGUP VEI), Moscow, Russia
  • fYear
    2010
  • fDate
    22-23 Sept. 2010
  • Firstpage
    454
  • Lastpage
    459
  • Abstract
    Now high-voltage switch devices find wider application in the powerful high-voltage electrotechnical equipment. Alongside with use of vacuum circuit-breakers with a mechanical drive there was a need for the high-speed switch device on the basis of electronic devices. For the decision of a problem of creation of a high-speed high-voltage switch it is expedient to use vacuum electronic devices. In particular, the individual vacuum device is capable to switch high voltage (up to 200 kV) while, for switching such voltage with semi-conductor devices it is required series connection of several tens devices. It is obvious, that reliability of such system will be inversely proportional to quantity of series connected semi-conductors. The vacuum high-voltage device possesses greater operation speed in comparison with semi-conductor, it is capable to work at temperature up to 300° C, moreover it withstand breakdowns and electromagnetic interferences. However, the basic obstacle for wide use of vacuum devices as a switch is the big direct voltage drop on opened device. The principle of deceleration of electron beam is used to decrease a direct voltage drop on the anode. The present work is devoted to questions of reduction of a direct voltage drop on the vacuum electronic switch device.
  • Keywords
    electric potential; electromagnetic interference; high-voltage techniques; semiconductor device breakdown; vacuum circuit breakers; direct voltage drop; electromagnetic interferences; electron beam deceleration; high speed high voltage vacuum electronic switch devices; mechanical drive; powerful high voltage electrotechnical equipment; series connected semiconductor devices; vacuum circuit breakers; Anodes; Electric breakdown; Electromagnetics; Electronic mail; Reliability; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
  • Conference_Location
    Saratov
  • Print_ISBN
    978-1-4244-6954-3
  • Type

    conf

  • DOI
    10.1109/APEDE.2010.5624069
  • Filename
    5624069