The impact of characteristic impedance on waveform calibrations

Author

Williams, Dylan F. ; Jargon, Jeffrey A. ; Hale, Paul D.

fYear

2013

fDate

7-7 June 2013

Firstpage

1

Lastpage

4

Abstract

We examine the impact of characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of coplanar lines can lead to statistically significant errors in the calibrations in both the time and frequency domains.

Keywords

calibration; coplanar waveguides; electric impedance measurement; electro-optical effects; frequency-domain analysis; time-domain analysis; characteristic impedance impact; coplanar line; coplanar waveguide; frequency domain analysis; high-speed electrooptic sampling measurement; impedance measurement; mismatch correction; temporal waveform calibration; time domain analysis; Frequency measurement; Measurement uncertainty; Microwave FET integrated circuits; Microwave integrated circuits; Microwave measurement; Microwave theory and techniques; Q measurement; Characteristic impedance; coplanar waveguide; electro-optic sampling; mismatch correction; on-wafer measurement; temporal waveform measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference (ARFTG), 2013 81st ARFTG

Conference_Location

Seattle, WA

Print_ISBN

978-1-4673-4981-9

Type

conf

DOI

10.1109/ARFTG.2013.6579023

Filename

6579023