Synthesized pulsed bias for device characterization

In this work we present a method capable of realising perfectly shaped bias pulses in practical measurement setups. With the proposed technique any user-defined pulse-shape can be generated, only limited by the bandwidth of the generation and acquisition system (i.e., speed of the DAC, modulator/driver and ADC). The detrimental effects on the pulse shape due to the connecting cables, the parasitic effects of the bias network and the non-linear loading provided by the device, can be fully eliminated. The unique capabilities of this method are experimentally demonstrated by accurately realizing sub-100ns voltage pulses with amplitudes up to 35V at the device reference plane.