• DocumentCode
    2886525
  • Title

    An effective algorithm for test application

  • Author

    Zijian, Zhou ; Junliang, Chen

  • Author_Institution
    Beijing Univ. of Posts & Telecommun., China
  • fYear
    1991
  • fDate
    16-17 Jun 1991
  • Firstpage
    663
  • Abstract
    DTS (dynamic test sequence) algorithm the simplification and extension of adaptive experiment, is developed as an engineering approach for locating faults more efficiently at PCB functional testing level. The application in a practical ATE system is presented in detail. Comparison with the arbitrary test application shows its advantages
  • Keywords
    automatic test equipment; dynamic testing; printed circuit testing; ATE system; DTS; PCB functional testing level; adaptive experiment; dynamic test sequence; fault location; Abstracts; Circuit faults; Circuit testing; Costs; Dictionaries; Fault location; Flip-flops; Kernel; Telecommunications; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/CICCAS.1991.184444
  • Filename
    184444
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2886525