DocumentCode
2886915
Title
Using lines of arbitrary impedance as standards on the TRL calibration technique
Author
Reynoso-Hernandez, J.A. ; Pulido-Gaytan, M.A. ; Zarate-de Landa, A. ; Zuniga-Juarez, J.E. ; Monjardin-Lopez, J.R. ; Garcia-Osorio, A. ; Orozco-Navarro, D. ; Loo-Yau, J.R. ; Maya-Sanchez, M.C.
Author_Institution
Centro de Investigaci??n Cient??fica y de Educaci??n Superior de Ensenada (CICESE), Ensenada B.C., M??xico
fYear
2013
fDate
7-7 June 2013
Firstpage
1
Lastpage
4
Abstract
Using the wave cascading matrix formalism and the 8-term error model for modeling the imperfect measurement system vector network analyzer a new approach of the Thru-Reflect-Line (TRL) calibration technique is introduced and compared with the already existing TRL calibration technique. This new approach allows the utilization of arbitrary characteristic impedance lines as calibration elements, being very useful for high power device characterization which requires impedance transformers. The proposed algorithm differs from the classical TRL in the procedure used to refer the DUT S-parameters to the system impedance.
Keywords
Calibration; Impedance; Power transmission lines; Scattering parameters; Transistors; Transmission line matrix methods; Transmission line measurements; TRL calibration; Vector network analyzer (VNA); characteristic impedance; wave cascading matrix;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location
Seattle, WA
Print_ISBN
978-1-4673-4981-9
Type
conf
DOI
10.1109/ARFTG.2013.6579059
Filename
6579059
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