• DocumentCode
    2886915
  • Title

    Using lines of arbitrary impedance as standards on the TRL calibration technique

  • Author

    Reynoso-Hernandez, J.A. ; Pulido-Gaytan, M.A. ; Zarate-de Landa, A. ; Zuniga-Juarez, J.E. ; Monjardin-Lopez, J.R. ; Garcia-Osorio, A. ; Orozco-Navarro, D. ; Loo-Yau, J.R. ; Maya-Sanchez, M.C.

  • Author_Institution
    Centro de Investigaci??n Cient??fica y de Educaci??n Superior de Ensenada (CICESE), Ensenada B.C., M??xico
  • fYear
    2013
  • fDate
    7-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Using the wave cascading matrix formalism and the 8-term error model for modeling the imperfect measurement system vector network analyzer a new approach of the Thru-Reflect-Line (TRL) calibration technique is introduced and compared with the already existing TRL calibration technique. This new approach allows the utilization of arbitrary characteristic impedance lines as calibration elements, being very useful for high power device characterization which requires impedance transformers. The proposed algorithm differs from the classical TRL in the procedure used to refer the DUT S-parameters to the system impedance.
  • Keywords
    Calibration; Impedance; Power transmission lines; Scattering parameters; Transistors; Transmission line matrix methods; Transmission line measurements; TRL calibration; Vector network analyzer (VNA); characteristic impedance; wave cascading matrix;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4673-4981-9
  • Type

    conf

  • DOI
    10.1109/ARFTG.2013.6579059
  • Filename
    6579059