DocumentCode
2887168
Title
Differential P+/Nwell varactor High Frequency Characterization
Author
Morandini, Yvan ; Rapisarda, Dario ; Larchanche, Jean-Francois ; Gaquière, Christophe
Author_Institution
STMicroelectron., Crolles
fYear
2007
fDate
19-22 March 2007
Firstpage
187
Lastpage
191
Abstract
Here we report, the evaluation of two differential integrated diode varactor layouts. For a first time, differential structures connected to an integrated BalUn are characterized with a two ports vector network analyzer (VNA). Limitations of this method lead us to use four ports measurements. Results reveal the best layout for differential implementation and the sensitivity to common mode.
Keywords
baluns; network analysers; semiconductor device testing; varactors; common mode sensitivity; differential P+/Nwell varactor; differential integrated diode varactor layouts; differential structures; high frequency characterization; integrated BalUn; vector network analyzer; Fingers; Impedance matching; Light emitting diodes; Microelectronics; Q factor; Radio frequency; Testing; Varactors; Voltage-controlled oscillators; Wireless communication; differential; four ports vector analyzer; high frequency (HF) characterization; integrated BalUn; varactor;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on
Conference_Location
Tokyo
Print_ISBN
1-4244-0781-8
Electronic_ISBN
1-4244-0781-8
Type
conf
DOI
10.1109/ICMTS.2007.374480
Filename
4252430
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