Title :
Differential P+/Nwell varactor High Frequency Characterization
Author :
Morandini, Yvan ; Rapisarda, Dario ; Larchanche, Jean-Francois ; Gaquière, Christophe
Author_Institution :
STMicroelectron., Crolles
Abstract :
Here we report, the evaluation of two differential integrated diode varactor layouts. For a first time, differential structures connected to an integrated BalUn are characterized with a two ports vector network analyzer (VNA). Limitations of this method lead us to use four ports measurements. Results reveal the best layout for differential implementation and the sensitivity to common mode.
Keywords :
baluns; network analysers; semiconductor device testing; varactors; common mode sensitivity; differential P+/Nwell varactor; differential integrated diode varactor layouts; differential structures; high frequency characterization; integrated BalUn; vector network analyzer; Fingers; Impedance matching; Light emitting diodes; Microelectronics; Q factor; Radio frequency; Testing; Varactors; Voltage-controlled oscillators; Wireless communication; differential; four ports vector analyzer; high frequency (HF) characterization; integrated BalUn; varactor;
Conference_Titel :
Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on
Conference_Location :
Tokyo
Print_ISBN :
1-4244-0781-8
Electronic_ISBN :
1-4244-0781-8
DOI :
10.1109/ICMTS.2007.374480
