DocumentCode
2887237
Title
The rectangular bipolar transistor tetrode structure and its application
Author
Schroter, M. ; Lehmann, S.
Author_Institution
Univ. of California at San Diego, La Jolla
fYear
2007
fDate
19-22 March 2007
Firstpage
206
Lastpage
209
Abstract
The operation of rectangular-shaped bipolar tetrode structures as well as the proper evaluation of measured data from such structures are discussed. Based on device simulation, which also serves for verification purposes, guidelines for the layout and for measurement data correction are presented. The application to experimental data is demonstrated.
Keywords
bipolar transistors; semiconductor device models; tetrodes; device simulation; measurement data correction; rectangular bipolar transistor tetrode structure; Bipolar transistors; Electrical resistance measurement; Geometry; Integrated circuit measurements; Monitoring; Process control; Radio frequency; Solid modeling; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on
Conference_Location
Tokyo
Print_ISBN
1-4244-0781-8
Electronic_ISBN
1-4244-0781-8
Type
conf
DOI
10.1109/ICMTS.2007.374484
Filename
4252434
Link To Document