DocumentCode
2887403
Title
Study on high reliable design method for lead-free solder joints on electronic components
Author
Takagi, Kanji ; Yu, Qiang ; Shibutani, Tadahiro ; Noro, Yukihiro
Author_Institution
Yokohama Nat. Univ., Yokohama, Japan
fYear
2010
fDate
2-5 June 2010
Firstpage
1
Lastpage
8
Abstract
This paper presents the high reliability design method for lead-free solder joints on chip components, and that is able to evaluate effect of soldering process for solder joint shape. Coupled analysis of structure analysis and flow analysis was proposed for replication of solder wetting and behavior of electric components at the same time. The analysis methods enable to evaluate complex mechanism of solder joint shape formation caused by soldering process fluctuation including the interaction between factors. Then, the estimated model of solder joint was evaluated the fatigue life using crack propagation analysis based on finite element method. The crack propagation method was provided the improvement for the complex behavior elucidation of crack propagation mode. Also, this paper indicated the importance of the analysis method for reliability design of solder joint in products required small-size and high reliability like automotive electronic components.
Keywords
cracks; finite element analysis; integrated circuit reliability; soldering; solders; wetting; chip component; complex behavior elucidation; coupled analysis; crack propagation analysis; electric component behavior; electronic component; fatigue life; finite element method; flow analysis; high reliability design; lead-free solder joints; solder joint shape; solder wetting; soldering process; structure analysis; Design methodology; Electronic components; Environmentally friendly manufacturing techniques; Fatigue; Finite element methods; Fluctuations; Lead; Life estimation; Shape; Soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location
Las Vegas, NV
ISSN
1087-9870
Print_ISBN
978-1-4244-5342-9
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2010.5501281
Filename
5501281
Link To Document