• DocumentCode
    2887403
  • Title

    Study on high reliable design method for lead-free solder joints on electronic components

  • Author

    Takagi, Kanji ; Yu, Qiang ; Shibutani, Tadahiro ; Noro, Yukihiro

  • Author_Institution
    Yokohama Nat. Univ., Yokohama, Japan
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents the high reliability design method for lead-free solder joints on chip components, and that is able to evaluate effect of soldering process for solder joint shape. Coupled analysis of structure analysis and flow analysis was proposed for replication of solder wetting and behavior of electric components at the same time. The analysis methods enable to evaluate complex mechanism of solder joint shape formation caused by soldering process fluctuation including the interaction between factors. Then, the estimated model of solder joint was evaluated the fatigue life using crack propagation analysis based on finite element method. The crack propagation method was provided the improvement for the complex behavior elucidation of crack propagation mode. Also, this paper indicated the importance of the analysis method for reliability design of solder joint in products required small-size and high reliability like automotive electronic components.
  • Keywords
    cracks; finite element analysis; integrated circuit reliability; soldering; solders; wetting; chip component; complex behavior elucidation; coupled analysis; crack propagation analysis; electric component behavior; electronic component; fatigue life; finite element method; flow analysis; high reliability design; lead-free solder joints; solder joint shape; solder wetting; soldering process; structure analysis; Design methodology; Electronic components; Environmentally friendly manufacturing techniques; Fatigue; Finite element methods; Fluctuations; Lead; Life estimation; Shape; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501281
  • Filename
    5501281