• DocumentCode
    288746
  • Title

    Multi-layer perceptron ensembles for increased performance and fault-tolerance in pattern recognition tasks

  • Author

    Filippi, E. ; Costa, M. ; Pasero, E.

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Torino, Italy
  • Volume
    5
  • fYear
    1994
  • fDate
    27 Jun-2 Jul 1994
  • Firstpage
    2901
  • Abstract
    Multilayer perceptrons (MLPs) have proven to be an effective way to solve classification tasks. A major concern in their use is the difficulty to define the proper network for a specific application, due to the sensitivity to the initial conditions and to overfitting and underfitting problems which limit their generalization capability. Moreover, time and hardware constraints may seriously reduce the degrees of freedom in the search for a single optimal network. A very promising way to partially overcome such drawbacks is the use of MLP ensembles: averaging and voting techniques are largely used in classical statistical pattern recognition and can be fruitfully applied to MLP classifiers. This work summarizes our experience in this field. A real-world OCR task is used as a test case to compare different models
  • Keywords
    multilayer perceptrons; pattern recognition; statistical analysis; OCR task; classification; fault-tolerance; multilayer perceptron ensembles; pattern recognition tasks; performance; statistical pattern recognition; Fault tolerance; Hardware; Multilayer perceptrons; Optical character recognition software; Pattern recognition; Sampling methods; Testing; Time factors; Training data; Voting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-1901-X
  • Type

    conf

  • DOI
    10.1109/ICNN.1994.374692
  • Filename
    374692