DocumentCode
288746
Title
Multi-layer perceptron ensembles for increased performance and fault-tolerance in pattern recognition tasks
Author
Filippi, E. ; Costa, M. ; Pasero, E.
Author_Institution
Dipartimento di Elettronica, Politecnico di Torino, Italy
Volume
5
fYear
1994
fDate
27 Jun-2 Jul 1994
Firstpage
2901
Abstract
Multilayer perceptrons (MLPs) have proven to be an effective way to solve classification tasks. A major concern in their use is the difficulty to define the proper network for a specific application, due to the sensitivity to the initial conditions and to overfitting and underfitting problems which limit their generalization capability. Moreover, time and hardware constraints may seriously reduce the degrees of freedom in the search for a single optimal network. A very promising way to partially overcome such drawbacks is the use of MLP ensembles: averaging and voting techniques are largely used in classical statistical pattern recognition and can be fruitfully applied to MLP classifiers. This work summarizes our experience in this field. A real-world OCR task is used as a test case to compare different models
Keywords
multilayer perceptrons; pattern recognition; statistical analysis; OCR task; classification; fault-tolerance; multilayer perceptron ensembles; pattern recognition tasks; performance; statistical pattern recognition; Fault tolerance; Hardware; Multilayer perceptrons; Optical character recognition software; Pattern recognition; Sampling methods; Testing; Time factors; Training data; Voting;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location
Orlando, FL
Print_ISBN
0-7803-1901-X
Type
conf
DOI
10.1109/ICNN.1994.374692
Filename
374692
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