• DocumentCode
    2887461
  • Title

    Automatic Measurement System to Characterize Low Power Type Power Supplies

  • Author

    Evans, G.A. ; Guastella, Pre P. ; Pittfield, P. E R j

  • Author_Institution
    AT&T TECHNOLOGIES, 50 LAWRENCE ROAD, SPRINGFIELD, NEW JERSEY 07081
  • fYear
    1984
  • fDate
    4-7 Nov. 1984
  • Firstpage
    478
  • Lastpage
    483
  • Abstract
    In order to quickly and accurately characterize low power type (less than l50 watts) power supplies, a computerized, automatic measurement system was developed. The system is capable of testing single and multiple output power supplies for static or dynamic voltage and current regulation, ripple voltage, and transient performance. Various types of linear and switching power supplies can be characterized on the measurement system. All tests may be performed under varying environmental conditions, such as temperature and humidity, plus various input voltage conditions. Combinations of conditions are possible to evaluate worst case situations. This system uses a minimum of external test equipment. Interconnections between the unit under test and the load are uncomplicated. Data can be collected quickly, assimilated for comparison, stored on disc or be provided as a hard copy. The system can be so configured as to have an operator who is not familiar with the equipment perform all phases of the testing, by simply following the computers instructions. Test results that manually would take up to an hour to collect can be automatically collected by the test system in two to three minutes. Because of the speed of the data collection, a more thorough complete evaluation of the power supply can be made.
  • Keywords
    Automatic testing; Current control; Humidity; Performance evaluation; Power generation; Power measurement; Power supplies; System testing; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications Energy Conference, 1984. INTELEC '84. International
  • Conference_Location
    New Orleans, LA, USA
  • Type

    conf

  • DOI
    10.1109/INTLEC.1984.4794169
  • Filename
    4794169