Title :
Near-field resonances in diagnostics of multilayered media
Author :
Gaikovich, K.P. ; Gaikovich, P.K.
Author_Institution :
Inst. for Phys. of Microstructures, RAS, Nizhny Novgorod, Russia
Abstract :
A method of the coherent near-field sounding of multilayered dielectric structures is studied. It is based on field measurements with subwavelength probes (emitting and receiving) that are spaced in the near-field zone above the upper layer of the studied structure. It makes possible to achieve a subwavelength resolution at the control of the layers´ depth. Especially high resolution can be achieved using the resonant response. The developed approach can be used, for instance, for the monitoring of epitaxy of multilayered heterostructures using SNOM techniques.
Keywords :
dielectric materials; epitaxial growth; multilayers; near-field scanning optical microscopy; permittivity; SNOM techniques; multilayered dielectric structures; multilayered heterostructures epitaxy; near-field resonances; subwavelength probes; Current measurement; Dielectric measurements; Dielectrics; Impedance; Nonhomogeneous media; Permittivity;
Conference_Titel :
Laser and Fiber-Optical Networks Modeling (LFNM), 2010 10th International Conference on
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-6994-9
DOI :
10.1109/LFNM.2010.5624180
