DocumentCode
2887541
Title
Designing for Reliability
Author
Klevenow, Fred ; Al Wehman
Author_Institution
Lorain Products, 1122 F Street, Lorain, Ohio 44052
fYear
1984
fDate
4-7 Nov. 1984
Firstpage
495
Lastpage
499
Abstract
This paper considers basic concepts of reliability of an electronic system. Basic terms are defined, and the effect of electrical stress, temperature and quality on reliability are graphed for various components per MIL-HDBK-217D. The reliability of a sample rectifier is then examined.
Keywords
Aircraft manufacture; Diodes; Environmental factors; History; Q factor; Rectifiers; Stress; System testing; Temperature; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Telecommunications Energy Conference, 1984. INTELEC '84. International
Conference_Location
New Orleans, LA, USA
Type
conf
DOI
10.1109/INTLEC.1984.4794172
Filename
4794172
Link To Document