• DocumentCode
    2887622
  • Title

    Thermal fatigue life evaluation of CSP joints by mechanical fatigue testing

  • Author

    Kanda, Yoshihiko ; Zama, Kunihiro ; Kariya, Yoshiharu ; Oota, Hironori ; Kikuchi, Shunichi ; Yamabe, Hideki ; Nakamura, Kazuhiko

  • Author_Institution
    Grad. Sch., Shibaura Inst. of Technol., Tokyo, Japan
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The interrelation between a thermal cycle test and a mechanical shear fatigue test has been studied for CSP joints from the view point of fatigue life and the microstructural damage of solder joints. The fatigue lives in both methods are almost equivalent even though loading method is different. From the viewpoint of microstructure, the fact is attributed to that the transgranular failure is predominant mode and a microstructural coarsening which is induced by thermal loading and stress equivalent for both the thermal cycle test and the mechanical shear fatigue test.
  • Keywords
    electronics packaging; life testing; solders; thermal stress cracking; CSP joints; chip size package; mechanical fatigue testing; mechanical shear fatigue test; microstructural coarsening; microstructural damage; solder joints; thermal cycle test; thermal fatigue life evaluation; Capacitive sensors; Fatigue; Life testing; Materials science and technology; Packaging; Soldering; Temperature; Thermal loading; Thermal resistance; Thermal stresses; CSP; Mechanical fatigue test; Microstructure; Sn-Ag-Cu; Thermal cycle test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501291
  • Filename
    5501291