DocumentCode
2887975
Title
Verification of ball-on-ring test using finite element analysis
Author
Chae, Seung-Hyun ; Zhao, Jie-Hua ; Edwards, Darvin R. ; Ho, Paul S.
Author_Institution
Univ. of Texas at Austin, Austin, TX, USA
fYear
2010
fDate
2-5 June 2010
Firstpage
1
Lastpage
6
Abstract
The ball-on-ring (BOR) test is an effective technique used to characterize the biaxial fracture strength of brittle materials. In particular, damages induced by wafer backgrinding process can be evaluated using the BOR test. It is difficult to measure directly the radius of contact area between the loading ball and a specimen, which is needed for stress determination by an analytic solution. In this study, parametric finite element analyses were performed to compare with known closed-form solutions. It was found that the effect of small loading area must not be ignored and that the radius of contact could be precisely determined using Hertz´s contact theory. This can serve as a guideline to accurately obtain the fracture strength of a BOR specimen.
Keywords
brittleness; finite element analysis; fracture toughness testing; stress analysis; wafer level packaging; BOR test; Hertz contact theory; ball-on-ring test; biaxial fracture strength; brittle material; contact radius; damage; parametric finite element analysis; stress determination; wafer backgrinding process; Area measurement; Closed-form solution; Finite element methods; Guidelines; Instruments; Materials testing; Performance analysis; Steel; Stress measurement; Tensile stress; Si die fracture; ball-on-ring (BOR); biaxial strength; contact radius; equivalent radius; finite element method;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location
Las Vegas, NV
ISSN
1087-9870
Print_ISBN
978-1-4244-5342-9
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2010.5501307
Filename
5501307
Link To Document