• DocumentCode
    2887975
  • Title

    Verification of ball-on-ring test using finite element analysis

  • Author

    Chae, Seung-Hyun ; Zhao, Jie-Hua ; Edwards, Darvin R. ; Ho, Paul S.

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The ball-on-ring (BOR) test is an effective technique used to characterize the biaxial fracture strength of brittle materials. In particular, damages induced by wafer backgrinding process can be evaluated using the BOR test. It is difficult to measure directly the radius of contact area between the loading ball and a specimen, which is needed for stress determination by an analytic solution. In this study, parametric finite element analyses were performed to compare with known closed-form solutions. It was found that the effect of small loading area must not be ignored and that the radius of contact could be precisely determined using Hertz´s contact theory. This can serve as a guideline to accurately obtain the fracture strength of a BOR specimen.
  • Keywords
    brittleness; finite element analysis; fracture toughness testing; stress analysis; wafer level packaging; BOR test; Hertz contact theory; ball-on-ring test; biaxial fracture strength; brittle material; contact radius; damage; parametric finite element analysis; stress determination; wafer backgrinding process; Area measurement; Closed-form solution; Finite element methods; Guidelines; Instruments; Materials testing; Performance analysis; Steel; Stress measurement; Tensile stress; Si die fracture; ball-on-ring (BOR); biaxial strength; contact radius; equivalent radius; finite element method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501307
  • Filename
    5501307