• DocumentCode
    2888051
  • Title

    Intermediate strain rate dependant mechanical properties for lead-free solders

  • Author

    Xu, Luhua ; Kok Ee Tan ; Pang, John H L

  • Author_Institution
    Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Lead-free solders have strain rate dependent mechanical properties. In this work we report the elastic modulus and yield strength of several lead-free solder alloys at different strain rates. They are SnAgCu (with Ag 1 to 4% and Cu at 0.5%, namely SAC105, SAC205, SAC305 and SAC405), SAC-X (X=In, Ni and Bi), SnCu, SnCu-X and SnAg alloys. The intermediate strain rate tests (10-3-101 1/sec) were conducted by using Nanoindentation continuous stiffness measurement (CSM) technique. For Sn3.8Ag0.7Cu solder alloy, the properties were studied at a range of strain rate from low strain rate (10-3 ~100 1/sec) using uni-axial tensile test. The effects of strain rate on the stress strain behavior for leadfree Sn3.8Ag0.7Cu solder are presented. For all the tests conducted, the higher the strain rate the higher the elastic modulus and yield stress of the solder; the higher strain rate, the higher the yield stress.
  • Keywords
    copper alloys; elastic moduli; silver alloys; solders; tensile testing; tin alloys; SnAgCu; elastic modulus; intermediate strain rate dependant mechanical properties; lead-free solders; nanoindentation continuous stiffness measurement; strain rate dependent mechanical properties; uniaxial tensile test; yield strength; Bismuth; Capacitive sensors; Copper alloys; Environmentally friendly manufacturing techniques; Lead; Mechanical factors; Strain measurement; Tensile strain; Tensile stress; Testing; hardness; lead-free; nanoindentation; solder; strain rate; tensile;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501311
  • Filename
    5501311