• DocumentCode
    2888267
  • Title

    Thermal performance of microchannels with wavy walls for electronics cooling

  • Author

    Gong, Liang ; Kota, Krishna ; Tao, Wenquan ; Joshi, Yogendra

  • Author_Institution
    Xi´´an Jiaotong Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Wavy walls are investigated in this paper as a passive scheme to improve the heat transfer performance of low Reynolds number laminar flows in microchannel heat sinks for electronics cooling applications. Three-dimensional laminar fluid flow and heat transfer characteristics in micro-wavy channels are numerically studied for a 500 μm hydraulic diameter channel by varying the wavy feature amplitude at different Reynolds numbers (10, 20, 50 and 100). In addition, flow measurements are made using micro-PIV technique for understanding the fundamentals of fluid flow in the wavy microchannels for the considered Reynolds numbers. Based on the comparison with straight channels, it was found that wavy channels can provide improved heat transfer performance, while keeping the pressure drop within acceptable limits. Accordingly, wavy channels are to found to provide an improvement of up to 26% in the overall performance compared to microchannels with straight walls and hence are attractive candidates for cooling of future electronics.
  • Keywords
    cooling; heat sinks; laminar flow; microchannel flow; thermal management (packaging); Reynolds number laminar flow; electronics cooling; flow measurement; heat transfer; micro-PIV technique; microchannel heat sinks; microwavy channel; size 500 micron; thermal performance; three-dimensional laminar fluid flow; wavy walls; Electronics cooling; Fluid flow; Fluid flow measurement; Heat sinks; Heat transfer; Hydraulic diameter; Microchannel; Microfluidics; Performance analysis; Thermal management of electronics; µ-PIV; Wavy channels; electronics cooling; heat transfer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501323
  • Filename
    5501323