DocumentCode
2888409
Title
Spatial Interestingness Measures for Co-location Pattern Mining
Author
Sengstock, C. ; Gertz, Michael ; Tran Van Canh
Author_Institution
Inst. of Comput. Sci., Heidelberg Univ., Heidelberg, Germany
fYear
2012
fDate
10-10 Dec. 2012
Firstpage
821
Lastpage
826
Abstract
Co-location pattern mining aims at finding subsets of spatial features frequently located together in spatial proximity. The underlying motivation is to model the spatial correlation structure between the features. This allows to discover interesting co-location rules (feature interactions) for spatial analysis and prediction tasks. As in association rule mining, a major problem is the huge amount of possible patterns and rules. Hence, measures are needed to identify interesting patterns and rules. Existing approaches so far focused on finding frequent patterns, patterns including rare features, and patterns occurring in small (local) regions. In this paper, we present a new general class of interestingness measures that are based on the spatial distribution of co-location patterns. These measures allow to judge the interestingness of a pattern based on properties of the underlying spatial feature distribution. The results are different from standard measures like participation index or confidence. To demonstrate the usefulness of these measures, we apply our approach to the discovery of rules on a subset of the OpenStreetMap point-of-interest data.
Keywords
data mining; pattern classification; association rule mining; colocation pattern mining; feature interactions; prediction tasks; spatial analysis; spatial correlation structure; spatial distribution; spatial feature distribution; spatial features; spatial interestingness measurement; spatial proximity; Atmospheric measurements; Bandwidth; Data mining; Entropy; Frequency measurement; Indexes; Particle measurements; Co-location pattern mining; density estimation; interestingness measures;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining Workshops (ICDMW), 2012 IEEE 12th International Conference on
Conference_Location
Brussels
Print_ISBN
978-1-4673-5164-5
Type
conf
DOI
10.1109/ICDMW.2012.116
Filename
6406524
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