Title :
Advances in thermal interface technology: mono-metal interconnect formation, processing and characterisation
Author :
Wunderle, B. ; Klein, M. ; Dietrich, L. ; Ras, M. Abo ; Mrossko, R. ; May, D. ; Schacht, R. ; Oppermann, H. ; Michel, B. ; Reichl, H.
Author_Institution :
Fraunhofer Inst. Reliability & Microintegration, Berlin, Germany
Abstract :
As the demand for new thermal technologies and materials has been increasing over the years to provide thermal solutions to the next generation of power electronics, microprocessors and high-power optical systems also thermal characterisation methods have to keep up with the pace of this development with respect to resolution and accuracy. We have developed both bulk and interface technologies to reduce thermal resistance using Ag and Au-based materials and low-T and low-p processes to render them eligible for the electronics industry. New processes to generate nano-enhanced surface structures as well as thermo-compression bonding are examined within this paper. Along with these processes especially designed test stands are described which are able to extract the effects achieved by the technological advances.
Keywords :
gold; gold alloys; interconnections; lead bonding; microprocessor chips; nanotechnology; silver; silver alloys; tape automated bonding; thermal resistance; Ag; Au; high-power optical systems; microprocessors; monometal interconnect formation; nanoenhanced surface structures; power electronics; thermal interface technology; thermal resistance; thermocompression bonding; Electronics industry; Microprocessors; Nanostructures; Optical interconnections; Optical materials; Power electronics; Power system interconnection; Rendering (computer graphics); Surface structures; Thermal resistance;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2010.5501343