DocumentCode
2888765
Title
Propagation modeling in complex rough environment based on ray tracing
Author
Fono, V.A. ; Talbi, Larbi ; Hakem, N.
Author_Institution
Univ. du Quebec en Outaouais, Gatineau, QC, Canada
fYear
2013
fDate
7-13 July 2013
Firstpage
1924
Lastpage
1925
Abstract
In this paper, a theoretical study of propagation mechanism in complex indoor environment is carried out. A ray-tracing approach is applied to set the parameters allowing characterizing the indoor propagation. Two cases are considered. First when the tunnel reflecting walls are supposed to be flat. In this case, path Loss and impulse response of the channel at 60 GHz are derived taking into account the radiation pattern of both transmitting and receiving antennas and the electromagnetic properties of the reflecting surfaces. In the second case, the study is extended to the case where the reflecting walls are described by periodical sinusoidal roughness. The Pathak approach has been applied to estimate the scattering effect by the surface roughness on the channel characterization parameters. This study opens the perspective to analyze propagation in environments with random rough surfaces.
Keywords
antenna radiation patterns; electromagnetic wave scattering; indoor radio; radiowave propagation; ray tracing; receiving antennas; transient response; transmitting antennas; Pathak approach; channel characterization parameters; complex indoor environment; complex rough environment; electromagnetic properties; frequency 60 GHz; impulse response; indoor propagation; path loss; periodical sinusoidal roughness; propagation mechanism; propagation modeling; radiation pattern; random rough surfaces; ray-tracing approach; receiving antennas; reflecting surfaces; scattering effect; surface roughness; transmitting antennas; tunnel reflecting walls; Antennas; Equations; Mathematical model; Rough surfaces; Scattering; Surface roughness; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2013 IEEE
Conference_Location
Orlando, FL
ISSN
1522-3965
Print_ISBN
978-1-4673-5315-1
Type
conf
DOI
10.1109/APS.2013.6711620
Filename
6711620
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