• DocumentCode
    2888993
  • Title

    Total cycle time management by operational elements

  • Author

    Kramer, Scott S.

  • Author_Institution
    IBM, Essex Junction, VT, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    17
  • Lastpage
    20
  • Abstract
    Manufacturing cycle time (or turnaround time) is the measure of speed with which work in process moves through the production line. At IBM´s semiconductor manufacturing plant in Essex Junction, Vermont, cycle time objectives are set in relation to raw process time (or tool time). Cycle time objectives are stated as a multiple of raw process time. Logic manufacturing cycle time objectives are met by the use of operational cycle time elements. These elements consist of cycle time through each individual operation in the process. By using computer analysis of these data, it is possible to identify and eliminate cycle time detractors. By managing cycle time by operational elements, overall product cycle time objectives are met. These objectives require a constant process of improved cycle time by identifying and eliminating detractors. The detractors can be eliminated by improved tool utilization, improved logistical flow, or modified staffing strategy
  • Keywords
    integrated circuit manufacture; management; semiconductor device manufacture; computer analysis; cycle time objectives; cycle time reduction; eliminating detractors; improved logistical flow; improved tool utilization; modified staffing strategy; operational cycle time elements; operational elements; overall product cycle time objectives; production line; raw process time; semiconductor manufacturing; tool time; total cycle time management; turnaround time; Electronic switching systems; Length measurement; Logic; Manufacturing processes; Production facilities; Resists; Semiconductor device manufacture; Technology management; Time measurement; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Science Symposium, 1989. ISMSS 1989., IEEE/SEMI International
  • Conference_Location
    Burlingame, CA
  • Type

    conf

  • DOI
    10.1109/ISMSS.1989.77236
  • Filename
    77236