• DocumentCode
    2889555
  • Title

    Proposed dark current studies at the argonne wakefield accelerator facility

  • Author

    Antipov, S. ; Spentzouris, L.K. ; Conde, M. ; Gai, W. ; Power, J.G. ; Yusof, Z. ; Dolgashev, V.

  • Author_Institution
    Illinois Inst. of Technol., Chicago
  • fYear
    2007
  • fDate
    25-29 June 2007
  • Firstpage
    2904
  • Lastpage
    2905
  • Abstract
    A study of dark currents has been initiated at the Argonne wakefield accelerator facility (AWA). Emission of dark current is closely related to a breakdown. Breakdown may include several factors such as local field enhancement, explosive electron emission, ohmic heating, tensile stress produced by electric field, and others. The AWA is building a dedicated facility to test various models for breakdown mechanisms and to determine the roles of different factors in the breakdown. An imaging system is being put together to identify single emitters on the cathode surface. This will allow us to study dark current properties in the gun. We also plan to trigger breakdown events with a high-powered laser at various wavelengths (IR to UV). Another experimental idea follows from the recent work on a Schottky-enabled photoemission in an RF photoinjector that allows us to determine in situ the field enhancement factor on a cathode surface. Monitoring the field enhancement factor before and after can shed some light on a modification of metal surface after the breakdown.
  • Keywords
    accelerator RF systems; electric breakdown; electron emission; electron guns; particle beam injection; photoemission; wakefield accelerators; AWA; Argonne wakefield accelerator; RF photoinjector; Schottky-enabled photoemission; breakdown mechanisms; cathode surface; dark current; electric field; electron guns; explosive electron emission; high-powered laser; imaging system; local field enhancement; metal surface; ohmic heating; tensile stress; Cathodes; Dark current; Electric breakdown; Electron emission; Explosives; Optical imaging; Radiofrequency identification; Resistance heating; Tensile stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2007. PAC. IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0916-7
  • Type

    conf

  • DOI
    10.1109/PAC.2007.4440615
  • Filename
    4440615