• DocumentCode
    2889865
  • Title

    Circuit performance variability reduction: principles, problems, and practical solutions

  • Author

    Styblinski, M.A. ; Zhang, J.C.

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • fYear
    1991
  • fDate
    11-14 Nov. 1991
  • Firstpage
    170
  • Lastpage
    173
  • Abstract
    The authors present several novel results in the area of variability minimization. They develop a variability gradient formula, give the theoretical conditions for variability minimization, and outline the principles and practical solutions of factor screening for variability. A multistage procedure is described for on-target design, based on variability gradient information, dynamic screening, performance variance minimization, and separate on-target tuning. This methodology was successfully applied to the variability minimization of a practical CMOS delay circuit, after several direct methods of on-target oriented methods failed.<>
  • Keywords
    CMOS integrated circuits; delays; integrated circuit technology; quality control; CMOS delay circuit; factor screening; multistage procedure; on-target tuning; performance variability reduction; performance variance minimization; variability gradient formula; variability minimization; Circuit noise; Circuit optimization; Circuit synthesis; Degradation; Design methodology; Instruments; Manufacturing processes; Minimization methods; Size control; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1991. ICCAD-91. Digest of Technical Papers., 1991 IEEE International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-2157-5
  • Type

    conf

  • DOI
    10.1109/ICCAD.1991.185222
  • Filename
    185222