DocumentCode
2890219
Title
Reliability considerations
Volume
III
fYear
1960
fDate
10-12 Feb. 1960
Firstpage
28
Lastpage
28
Abstract
Lists discussion sessions presented at the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1960.1157243
Filename
1157243
Link To Document