• DocumentCode
    289028
  • Title

    Fault-diameter of the star-connected cycles interconnection network

  • Author

    Azevedo, Marcelo M. ; Bagherzadeh, Nader ; Latifi, Shahram

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    3-6 Jan 1995
  • Firstpage
    469
  • Abstract
    Let G be a graph with vertex connectivity k(G). An important measure of the fault tolerance of G is its fault-diameter df(G), which is defined as the maximum diameter resulting from the deletion of any set of nodes containing less than k(G) nodes. The robustness of G is often measured by comparing df(G) with the diameter of the fault-free G, namely d(G). In particular, a family of graphs Gn is dubbed strongly resilient if df(G n)⩽d(Gn)+c, where c is a fixed constant independent of n. This paper derives the fault-diameter of the star-connected cycles (SCC) interconnection network. We show that the SCCn graph is strongly resilient, exhibiting a fault-diameter of df(SCC3)=d(SCC3)+4, df(SCC4)=d(SCC4)+5, and df(SCCn)=d(SCCn)+1, for n⩾5
  • Keywords
    fault tolerant computing; graph theory; multiprocessor interconnection networks; parallel architectures; reliability; fault tolerance; fault-diameter; fault-free; fixed constant; graph; maximum diameter; star-connected cycles interconnection network; vertex connectivity; Computer networks; Fault tolerance; Geophysics computing; Hypercubes; Level measurement; Multiprocessor interconnection networks; Resilience;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Sciences, 1995. Proceedings of the Twenty-Eighth Hawaii International Conference on
  • Conference_Location
    Wailea, HI
  • Print_ISBN
    0-8186-6930-6
  • Type

    conf

  • DOI
    10.1109/HICSS.1995.375510
  • Filename
    375510