Behavior analysis of the IGBT in ZCS commutation based in a soft modeling concept

Author

Claudio, A. ; Cotorogea, M. ; Aguayo, J. ; Vela, L.G.

Author_Institution

Power Electron. Group, Nat. Center for Res. & Technol. Dev., Cuernavaca, Mexico

fYear

2000

fDate

2000

Firstpage

97

Lastpage

101

Abstract

This work presents a study of the insulated gate bipolar transistor (IGBT) behavior in ZC soft switching mode. This analysis is based on a soft modeling concept of power electronics devices, which gives important knowledge of the semiconductor, normally not accessed by experimental means and addressed to the circuit users. For example the carrier concentration at emitter end of the base, the instantaneous excess charge, the MOS and bipolar current and voltage distributions are available. A simple analytical model (soft modeling) taking into account the essential physical phenomena has been developed for the IGBT in MATLAB, as a compromise between the ideal switch and the complex models applied to components design. The simulation results obtained with soft modeling will be used to study the commutation behavior of the IGBT under zero current switch conditions

Keywords

bipolar transistor switches; commutation; electronic engineering computing; insulated gate bipolar transistors; power bipolar transistors; power engineering computing; power semiconductor switches; semiconductor device models; switching circuits; IGBT behavior analysis; MATLAB; ZCS commutation; carrier concentration; computer simulation; current distributions; instantaneous excess charge; power electronics devices; soft modelling concept; soft switching; voltage distributions; Analytical models; Circuit simulation; Circuit testing; Insulated gate bipolar transistors; Mathematical model; Physics; Power electronics; Power semiconductor switches; Switching circuits; Zero current switching;

fLanguage

English

Publisher

ieee

Conference_Titel

Computers in Power Electronics, 2000. COMPEL 2000. The 7th Workshop on

Conference_Location

Blacksburg, VA

Print_ISBN

0-7803-6561-5

Type

conf

DOI

10.1109/CIPE.2000.904698

Filename

904698