Title :
Microwave interactions in bulk semiconductors: A survey
Author_Institution :
Varian Associates, Palo Alto, CA, USA
Keywords :
Cyclotrons; Electric resistance; Electromagnetic radiation; Electrons; Frequency; Magnetic fields; Masers; Microwave devices; Plasma properties; Thermal resistance;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1960.1157248
