Title :
HIVE: an efficient interconnect capacitance extractor to support submicron multilevel interconnect designs
Author :
Chang, K.-J. ; Oh, S.-Y. ; Lee, K.
Author_Institution :
Hewlett-Parkard Co., Palo Alto, CA, USA
Abstract :
A novel paradigm for efficiently providing 2-D and 3-D submicron multilevel (SMML) interconnect capacitances to support VLSI/ULSI designs regarding RC delay, electromigration, and crosstalk has been developed. According to SMML interconnect process measurements and simulations, when the interconnect width/space changes, the corresponding changes of the ground and coupling capacitances are linear in some cases and nonlinear in other cases. A set of representative SMML layout structures is selected so that rigorous 2-D and 3-D simulations are done for the nonlinear changes in advance, and fast interpolations/extrapolations are done for the linear changes when circuit designers specify the width/space of interconnects.<>
Keywords :
VLSI; capacitance; circuit analysis computing; circuit layout CAD; crosstalk; delays; electromigration; metallisation; 2D simulations; 3D simulations; RC delay; SMML layout structures; coupling capacitances; crosstalk; electromigration; extrapolations; interconnect capacitance extractor; interconnect process measurements; interconnect width; interpolations; nonlinear changes; submicron multilevel interconnect designs; Capacitance measurement; Circuit simulation; Coupling circuits; Crosstalk; Delay; Electromigration; Integrated circuit interconnections; Interpolation; Ultra large scale integration; Very large scale integration;
Conference_Titel :
Computer-Aided Design, 1991. ICCAD-91. Digest of Technical Papers., 1991 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2157-5
DOI :
10.1109/ICCAD.1991.185257