• DocumentCode
    2890355
  • Title

    From Li-ion single cell model to battery pack simulation

  • Author

    Dubarry, Matthieu ; Vuillaume, Nicolas ; Liaw, Bor Yann

  • Author_Institution
    Hawaii Natural Energy Inst., Univ. of Hawaii at Manoa, Honolulu, HI
  • fYear
    2008
  • fDate
    3-5 Sept. 2008
  • Firstpage
    708
  • Lastpage
    713
  • Abstract
    A universal modeling and simulation approach for rechargeable lithium batteries is presented in this paper to introduce a practical method to conduct battery pack simulation from accurate cell models that can account for cell imbalance. We used a model based on an equivalent circuit technique commonly used in electrochemical impedance characterizations. Our approach uses parameters deduced directly from cell testing, which promise a convenient integration with live cell monitoring and control circuitry. Such integration accompanied with the generic nature of the model offers the universality in this modeling approach. We began with the explanation of a single cell model which is validated against experimental data to demonstrate its validity of high accuracy. A highly accurate single cell model is essential for the derivation of reliable statistical confidence interval to accurately account for the intrinsic imbalance of the cells in the pack. We then demonstrated that a high fidelity pack simulation can be achieved when such imbalance was accounted for.
  • Keywords
    electrochemistry; equivalent circuits; secondary cells; battery pack simulation; cell imbalance; cell testing; electrochemical impedance characterizations; equivalent circuit technique; rechargeable lithium batteries; single cell model; statistical confidence interval; Batteries; Circuit simulation; Circuit testing; Computational modeling; Control system synthesis; Equivalent circuits; Laboratories; Lithium; Predictive models; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications, 2008. CCA 2008. IEEE International Conference on
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    978-1-4244-2222-7
  • Electronic_ISBN
    978-1-4244-2223-4
  • Type

    conf

  • DOI
    10.1109/CCA.2008.4629598
  • Filename
    4629598