DocumentCode

2890400

Title

Measurement of absolute noise performance of parametric amplifiers

Author

Rafuse, R.

Author_Institution

MIT, Cambridge, MA, USA

Volume

III

fYear

1960

fDate

10-12 Feb. 1960

Firstpage

95

Lastpage

96

Keywords

Bandwidth; Circuits; Cutoff frequency; Diodes; Helium; Impedance measurement; Noise figure; Noise measurement; Pain; Varactors;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1960.1157253

Filename

1157253