Title :
Measurement of absolute noise performance of parametric amplifiers
Author_Institution :
MIT, Cambridge, MA, USA
Keywords :
Bandwidth; Circuits; Cutoff frequency; Diodes; Helium; Impedance measurement; Noise figure; Noise measurement; Pain; Varactors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1960.1157253
