DocumentCode
2890411
Title
A price-performance model and parameter sensitivity analysis for semiconductor assembly equipment
Author
Raghavan, A.S. ; Crosby, Lawrence J.
Author_Institution
Kulicke & Soffa Ind. Inc., Willow Grove, PA, USA
fYear
1989
fDate
22-24 May 1989
Firstpage
95
Lastpage
98
Abstract
A set of price-performance computer models, developed to analyze and evaluate semiconductor assembly equipment and operations, is presented. The set includes models for wafer preparation equipment, wafer dicing systems, die attach systems, and wire bonding systems. Variable parameters to be entered into the models are of three categories: (1) equipment performance data; (2) equipment maintenance data; and (3) economic data. For a given set of parameters, the models develop the assembly costs per thousand devices for each of two cases: (1) assembly costs less chip cost, and (2) assembly costs including yield loss cost. The parameters for a specific device, manufactured at a hypothetical assembly operation in Asia, are used for presentation purposes. The results produced by the models are discussed and analyzed. As an extension of the model, a sensitivity analysis of the wire bonding model is also presented. The specific and relative effects of variations in yield, footprint, mean time between assists, mean time between failures, and throughput on the cost per thousand devices assembled are examined
Keywords
economics; electronic engineering computing; microassembling; semiconductor device manufacture; sensitivity analysis; computer models; die attach systems; economic data; economics; equipment maintenance data; equipment performance data; parameter sensitivity analysis; price-performance model; semiconductor assembly equipment; wafer dicing systems; wafer preparation equipment; wire bonding systems; yield loss cost; Asia; Assembly; Costs; Manufacturing; Microassembly; Semiconductor device modeling; Sensitivity analysis; Throughput; Wafer bonding; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Science Symposium, 1989. ISMSS 1989., IEEE/SEMI International
Conference_Location
Burlingame, CA
Type
conf
DOI
10.1109/ISMSS.1989.77253
Filename
77253
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