• DocumentCode
    2890411
  • Title

    A price-performance model and parameter sensitivity analysis for semiconductor assembly equipment

  • Author

    Raghavan, A.S. ; Crosby, Lawrence J.

  • Author_Institution
    Kulicke & Soffa Ind. Inc., Willow Grove, PA, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    95
  • Lastpage
    98
  • Abstract
    A set of price-performance computer models, developed to analyze and evaluate semiconductor assembly equipment and operations, is presented. The set includes models for wafer preparation equipment, wafer dicing systems, die attach systems, and wire bonding systems. Variable parameters to be entered into the models are of three categories: (1) equipment performance data; (2) equipment maintenance data; and (3) economic data. For a given set of parameters, the models develop the assembly costs per thousand devices for each of two cases: (1) assembly costs less chip cost, and (2) assembly costs including yield loss cost. The parameters for a specific device, manufactured at a hypothetical assembly operation in Asia, are used for presentation purposes. The results produced by the models are discussed and analyzed. As an extension of the model, a sensitivity analysis of the wire bonding model is also presented. The specific and relative effects of variations in yield, footprint, mean time between assists, mean time between failures, and throughput on the cost per thousand devices assembled are examined
  • Keywords
    economics; electronic engineering computing; microassembling; semiconductor device manufacture; sensitivity analysis; computer models; die attach systems; economic data; economics; equipment maintenance data; equipment performance data; parameter sensitivity analysis; price-performance model; semiconductor assembly equipment; wafer dicing systems; wafer preparation equipment; wire bonding systems; yield loss cost; Asia; Assembly; Costs; Manufacturing; Microassembly; Semiconductor device modeling; Sensitivity analysis; Throughput; Wafer bonding; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Science Symposium, 1989. ISMSS 1989., IEEE/SEMI International
  • Conference_Location
    Burlingame, CA
  • Type

    conf

  • DOI
    10.1109/ISMSS.1989.77253
  • Filename
    77253