DocumentCode
2890498
Title
Low-power design under variation using error prevention and error tolerance (invited paper)
Author
Chae, Kwanyeob ; Cho, Minki ; Mukhopadhyay, Saibal
Author_Institution
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA-30332
fYear
2012
fDate
10-13 April 2012
Firstpage
1
Lastpage
6
Abstract
This paper presents error tolerance and error prevention methodologies to reduce power dissipation in digital circuits under process variations. For logic circuits, timing error prevention using time-borrowing and clock stretching is discussed as a feasible approach to reduce power dissipation for a target throughput. The natural error tolerance in image processing applications is exploited to reduce power dissipations in Static Random Access Memory (SRAM).
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop (LATW), 2012 13th Latin American
Conference_Location
Quito, Ecuador
Print_ISBN
978-1-4673-2355-0
Type
conf
DOI
10.1109/LATW.2012.6261232
Filename
6261232
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