• DocumentCode
    2890498
  • Title

    Low-power design under variation using error prevention and error tolerance (invited paper)

  • Author

    Chae, Kwanyeob ; Cho, Minki ; Mukhopadhyay, Saibal

  • Author_Institution
    School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA-30332
  • fYear
    2012
  • fDate
    10-13 April 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents error tolerance and error prevention methodologies to reduce power dissipation in digital circuits under process variations. For logic circuits, timing error prevention using time-borrowing and clock stretching is discussed as a feasible approach to reduce power dissipation for a target throughput. The natural error tolerance in image processing applications is exploited to reduce power dissipations in Static Random Access Memory (SRAM).
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2012 13th Latin American
  • Conference_Location
    Quito, Ecuador
  • Print_ISBN
    978-1-4673-2355-0
  • Type

    conf

  • DOI
    10.1109/LATW.2012.6261232
  • Filename
    6261232