Title :
Solid-state micrologic elements
Author :
Norman, R. ; Last, J. ; Haas, I.
Author_Institution :
Fairchild Semiconductor Corporation, Palo Alto, CA, USA
Keywords :
Assembly; Computer aided manufacturing; Cost function; Life testing; Logic functions; Logic testing; Military computing; Packaging; Shift registers; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1960.1157264
