DocumentCode :
2890576
Title :
Solid-state micrologic elements
Author :
Norman, R. ; Last, J. ; Haas, I.
Author_Institution :
Fairchild Semiconductor Corporation, Palo Alto, CA, USA
Volume :
III
fYear :
1960
fDate :
10-12 Feb. 1960
Firstpage :
82
Lastpage :
83
Keywords :
Assembly; Computer aided manufacturing; Cost function; Life testing; Logic functions; Logic testing; Military computing; Packaging; Shift registers; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1960.1157264
Filename :
1157264
Link To Document :
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