Title :
Backward traveling-wave parametric amplifiers
Author_Institution :
General Electric Co., Syracuse, NY, USA
Keywords :
Bandwidth; Equations; Frequency measurement; Insertion loss; Laboratories; Loss measurement; Performance loss; Power amplifiers; Power measurement; Tunable circuits and devices;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1960.1157267