Title :
A multi-objective optimization for memory BIST sharing using a genetic algorithm
Author :
Zaourar, Lilia ; Kieffer, Yann ; Wenzel, Arnaud
Author_Institution :
SOC Dept., LIP6 Lab., Paris, France
Abstract :
The memory BIST insertion involves the simultaneous optimization of several conflicting and competing objectives such as test time and power consumption during the test execution procedure. In this paper, a new memory BIST methodology is proposed which optimizes area overhead, test power and test time. It exploits Genetic Algorithms to find a set of Pareto optimal solutions. Since the designer is given a set of trade-off solutions between the three criteria, thus he can choose the most suitable one for his memory testing needs. The proposed algorithm is rigorously tested using several industrial designs.
Keywords :
built-in self test; genetic algorithms; integrated circuit testing; memory architecture; genetic algorithm; memory BIST sharing; memory testing; multiobjective optimization; pareto optimal solutions; Biological cells; Built-in self-test; Genetic algorithms; Memory management; Optimization; Power demand; Multi-objective optimization; genetic algorithm; memory BIST;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993814
