Title :
A reliable fault classifier for dependable systems on SRAM-based FPGAs
Author :
Bolchini, Cristiana ; Sandionigi, Chiara ; Fossati, Luca ; Codinachs, David Merodio
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery possibility; some faults can be recovered by reconfiguring the faulty part of the device, others have a destructive effect. After classification has been carried out, the suitable fault recovery strategy is applied, with the final aim of enabling the exploitation of FPGAs, in particular SRAM-based ones, for critical applications, such as the ones in the space environment. In this scenario, we investigate the reliable implementation of the fault classification algorithm, that can be so integrated in an overall reliable system.
Keywords :
SRAM chips; fault diagnosis; field programmable gate arrays; integrated circuit reliability; pattern classification; FPGA; SRAM; dependable systems; fault classification algorithm; fault recovery strategy; Algorithm design and analysis; Field programmable gate arrays; Orbits; Radiation detectors; Registers; Reliability; Single event upset;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993817
