Title :
An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities
Author :
Flaquer, Josep Torras ; Daveau, Jean Marc ; Naviner, Lirida ; Roche, Philippe
Author_Institution :
Central CAD & Design Solutions (CCDS), STMicrolectronics, Crolles, France
Abstract :
We propose a novel approach relying on signal state conditional probabilities and circuit clustering to perform a probabilistic analytical estimation of the reliability of combinatorial logic circuits. This approach uses clustering and joint conditional probabilities to reduce the execution time and matrix size needed. Its effectiveness is demonstrated on a 8 bit Brent Kung adder.
Keywords :
adders; combinational circuits; integrated circuit reliability; pattern clustering; probability; Brent Kung adder; circuit clustering; combinatorial logic circuit reliability; combinatorial logic netlist reliability analysis; probabilistic analytical estimation; signal state conditional probability; word length 8 bit; Adders; Circuit faults; Integrated circuit reliability; Joints; Logic gates; Probabilistic logic; SER; SET; circuit clustering; circuit reliability; logic design; probability; reliability estimation;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993818