DocumentCode :
2890921
Title :
SITARe: A simulation tool for analysis and diagnosis of radiation effects
Author :
Micolau, G. ; Castellani-Coulié, K. ; Aziza, H. ; Portal, J.-M.
Author_Institution :
IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinopôle de Château - Gombert, 13451 Cedex 20, France
fYear :
2012
fDate :
10-13 April 2012
Firstpage :
1
Lastpage :
5
Abstract :
This work provides reliability criteria to detect and diagnose multi-events upset by the use of a SER tool. The study is based on a charge generation model used to simulate the impact of an ionizing particle striking the sensitive nodes of a SRAM cell. The currents, collected at the sensitive nodes are generated by the physical model and injected at circuit level. Thus, a correlation between the circuit electrical behavior and injected currents is established to provide a reliability criterion.
Keywords :
Multi-Events diagnosis; Reliability; SRAM; Single Event Upset;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Workshop (LATW), 2012 13th Latin American
Conference_Location :
Quito, Ecuador
Print_ISBN :
978-1-4673-2355-0
Type :
conf
DOI :
10.1109/LATW.2012.6261254
Filename :
6261254
Link To Document :
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