• DocumentCode
    2890921
  • Title

    SITARe: A simulation tool for analysis and diagnosis of radiation effects

  • Author

    Micolau, G. ; Castellani-Coulié, K. ; Aziza, H. ; Portal, J.-M.

  • Author_Institution
    IM2NP-UMR CNRS 7334 / Aix-Marseille University, IM2NP, IMT Teclinopôle de Château - Gombert, 13451 Cedex 20, France
  • fYear
    2012
  • fDate
    10-13 April 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This work provides reliability criteria to detect and diagnose multi-events upset by the use of a SER tool. The study is based on a charge generation model used to simulate the impact of an ionizing particle striking the sensitive nodes of a SRAM cell. The currents, collected at the sensitive nodes are generated by the physical model and injected at circuit level. Thus, a correlation between the circuit electrical behavior and injected currents is established to provide a reliability criterion.
  • Keywords
    Multi-Events diagnosis; Reliability; SRAM; Single Event Upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2012 13th Latin American
  • Conference_Location
    Quito, Ecuador
  • Print_ISBN
    978-1-4673-2355-0
  • Type

    conf

  • DOI
    10.1109/LATW.2012.6261254
  • Filename
    6261254