Title :
Spin-based devices for future microelectronics
Author :
Sverdlov, Viktor ; Selberherr, Siegfried
Author_Institution :
Inst. for Microelectron., Vienna, Austria
Abstract :
With CMOS technology rapidly approaching its scaling limits, the electron spin attracts much attention as an alternative degree of freedom for low-power applications. Silicon is suited for spin-driven applications because of its long spin lifetime. In confined electron systems the spin lifetime can be increased significantly by uniaxial stress. However, despite the many achievements, an experimental demonstration of a spin-based field effect transistor (SpinFET) is pending due to low spin injection efficiency and difficulties to manipulate spins electrically. This motivates researchers to look into CMOS-compatible spin-driven devices. Spin-transfer torque MRAM is fast, compact, and non-volatile; however, the high current for magnetization switching is a challenge. For in-plane magnetization a substantial reduction of the current is achieved, when the free layer is composed of two parts. In addition to information storing, the same MRAM cells can also be used for information processing, paving a path towards non-volatile logic-in-memory architectures.
Keywords :
CMOS integrated circuits; MRAM devices; field effect transistors; low-power electronics; spin; CMOS technology; SpinFET; alternative degree of freedom; electron spin; electron systems; information processing; low-power applications; magnetization switching; microelectronics; nonvolatile logic-in-memory architectures; spin lifetime; spin-based devices; spin-based field effect transistor; spin-driven applications; spin-transfer torque MRAM; uniaxial stress; Logic gates; Magnetic separation; Magnetic tunneling; Magnetization; Silicon; Spin polarized transport; Switches;
Conference_Titel :
Next-Generation Electronics (ISNE), 2015 International Symposium on
Conference_Location :
Taipei
DOI :
10.1109/ISNE.2015.7132030