DocumentCode
2891060
Title
Reduced overhead soft error mitigation using error control coding techniques
Author
Prasanth, Venugopal ; Singh, Virendra ; Parekhji, Rubin
Author_Institution
Comput. Design & Test Lab., Indian Inst. of Sci., Bangalore, India
fYear
2011
fDate
13-15 July 2011
Firstpage
163
Lastpage
168
Abstract
Soft errors are one of the biggest reliability challenges for present day electronic devices. With technology scaling, the contribution of soft errors to overall device failure is on the rise and it is becoming the dominant reliability failure mechanism. Several techniques exist for the detection and correction of soft errors. Reducing implementation overhead is one of the areas which researchers were focusing on, and several optimization techniques are being proposed. In this paper, we propose a novel methodology, using error detection and correction codes to reduce the implementation overhead. We extend the earlier work on delayed capture methodology, and divide the total number of flip-flops into various groups and calculate the check bits for each group. This method exploits the reduction in the fault space which is generated due to single event upsets, and illustrates how the detection and correction implementation overheads can be minimized. Experimental results highlight the effectiveness of this technique. As compared to the original implementation, 44.80% reduction in area is obtained, without sacrificing the coverage.
Keywords
error correction codes; error detection codes; flip-flops; integrated circuit reliability; optimisation; device failure; electronic devices; error control coding techniques; error correction code; error detection code; flip-flops; optimization techniques; reduced overhead soft error mitigation; reliability challenges; reliability failure mechanism; soft error correction; soft error detection; Circuit faults; Clocks; Error correction; Flip-flops; Logic gates; Redundancy; Timing; Error Control Coding; Fault space reduction; Soft errors;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location
Athens
Print_ISBN
978-1-4577-1053-7
Type
conf
DOI
10.1109/IOLTS.2011.5993831
Filename
5993831
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